Factor impact applied surface science

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Engineering ultrafast magnetism in ultrafast magnetism Factor impact applied surface science. In: Springer Proceedings in Physics Vol. Silva TJ, Turgut E, Mathias S, La-o-vorakiat C, Grychtol P, Adam R, et al. Ultrafast, element-specific magnetization dynamics of multi-constituent magnetic materials by use of high-harmonic generation.

Factor impact applied surface science Ultrafast Magnetism I. Springer Proceedings in Physics Vol. Eriksson M, van der Veen JF, Quitmann C. Factor impact applied surface science storage rings - a window to the science of tomorrow.

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Element-specific magnetic microscopy with circularly polarized X-rays. Fischer P, Schutz G, Schmahl G, Guttmann P, Raasch D. Imaging of magnetic domains with the X-ray microscope at BESSY using X-ray magnetic circular dichroism. Kilcoyne AL, Tyliszczak T, Steele WF, Fakra S, Hitchcock P, Franck K, et al.

Interferometer-controlled scanning transmission X-raymicroscopes at the advanced factor impact applied surface science source. Acremann Y, Strachan JP, Chembrolu V, Andrews SD, Tyliszczak T, Katine JA, et factor impact applied surface science. Time-resolved imaging of spin transfer switching: beyond the macrospin concept.

Pilet N, Raabe J, Stevenson SE, Romer S, Bernard L, McNeill CR, et al. Guttmann P, Bittencourt C, Rehbein S, Umek P, Ke X, Van Tendeloo G, et al. Nanoscale spectroscopy with больше на странице X-rays by NEXAFS-TXM. Nat Photonics (2012) 6:25.

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Proc Natl Acad Sci USA. Dierolf M, Menzel A, Thibault P, Schneider P, Kewish CM, Wepf R, et al. Ptychographic X-ray computed tomography at the nanoscale. Chang C, Sakdinawat A, Fischer P, Anderson E, Attwood D. Single-element objective lens for soft x-ray differential interference contrast microscopy.

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Fluorescence microscopy with diffraction resolution barrier broken by stimulated emission. Chao W, Kim J, Rekawa S, Factor impact applied surface science P, Anderson EH. Real space soft x-ray imaging at 10 nm spatial resolution. Vila-Comamala J, Jefimovs K, Raabe J, Fink RH, Senoner M, Maszdorf A, et al. Advanced thin film technology for ultra high resolution X-ray microscopy.

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26.04.2020 in 00:22 necoofe1984:
Я извиняюсь, но, по-моему, Вы не правы. Я уверен. Предлагаю это обсудить. Пишите мне в PM.